Four-point probe resistance measurements using PtIr-coated carbon nanotube tips.
نویسندگان
چکیده
We performed four-terminal conductivity measurements on a CoSi2 nanowire (NW) at room temperature by using PtIr-coated carbon nanotube (CNT) tips in a four-tip scanning tunneling microscope. The physical stability and high aspect ratio of the CNT tips made it possible to reduce the probe spacing down to ca. 30 nm. The probe-spacing dependence of resistance showed diffusive transport even at 30 nm and no current leakage to the Si substrate.
منابع مشابه
High-yield synthesis of conductive carbon nanotube tips for multiprobe scanning tunneling microscope.
We have established a fabrication process for conductive carbon nanotube (CNT) tips for multiprobe scanning tunneling microscope (STM) with high yield. This was achieved, first, by attaching a CNT at the apex of a supporting W tip by a dielectrophoresis method, second, by reinforcing the adhesion between the CNT and the W tip by electron beam deposition of hydrocarbon and subsequent heating, an...
متن کاملMagnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes
Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...
متن کاملEvaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy
Using an atomic force microscope (AFM) at a controlled contact force, we report the electrical signal response of multi-walled carbon nanotubes (MWCNTs) disposed on a golden thin film. In this investigation, we highlight first the theoretical calculation of the contact resistance between two types of conductive tips (metal-coated and doped diamond-coated), individual MWCNTs and golden substrate...
متن کاملAssessment of the mechanical integrity of silicon and diamond-like carbon coated silicon atomic force microscope probes
The wear of atomic force microscope (AFM) tips is a critical issue in the performance of probe-based metrology and nanomanufacturing processes. In this work, diamond-like carbon (DLC) was coated on Si AFM tips using a plasma ion implantation and deposition process. The mechanical integrity of these DLC-coated tips was compared to that of uncoated silicon tips through systematic nanoscale wear t...
متن کاملHigh-Yield Assembly of Individual Single-Walled Carbon Nanotube Tips for Scanning Probe Microscopies
The structural and mechanical properties of single-walled carbon nanotubes (SWNTs) make them ideal tips for scanning probe microscopies such as atomic force microscopy (AFM). However, the ideal nanotube probe, which corresponds to an individual SWNT, has been difficult to produce in high yield. To overcome this difficulty, a straightforward and easily implemented method that enables very high-y...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
- Nano letters
دوره 7 4 شماره
صفحات -
تاریخ انتشار 2007